Доступная литература по надёжности РЭА писалась в 60х, когда транзисторы были очень большими, ага?
Вот тут пишут:
http://spectrum.ieee.org/computing/hardware/how-to-kill-a-supercomputer-dirty-power-cosmic-rays-and-bad-solder
The problem was that an address bus on the microprocessors found in those servers was unprotected, meaning that there was no check to make sure the information carried on these within-chip signal lines did not become corrupted. And that’s exactly what was happening when these chips were struck by cosmic radiation, the constant shower of particles that bombard Earth’s atmosphere from outer space.
....
Cosmic rays are a fact of life, and as transistors get smaller, the amount of energy it takes to spontaneously flip a bit gets smaller, too. By 2023, when exascale computers—ones capable of performing 1018 operations per second—are predicted to arrive in the United States, transistors will likely be a third the size they are today, making them that much more prone to cosmic ray–induced errors.
И это не "британские учёные из Гуголя", а статья из официального журнала
IEEE
P.S. Кстати ещё в 1979 году статьи на эту тему писались:
https://www.ncbi.nlm.nih.gov/pubmed/17820742
A method is developed for evaluating the effects of cosmic rays on computer memories and is applied to some typical memory devices. The sea-level flux of cosmic-ray particles is reviewed and the interaction of each type of particle with silicon is estimated, with emphasis on processes that produce bursts of charge. These charge pulses are then related to typical computer large-scale integrated circuit components and cosmic-ray-induced errors are estimated. The effects of shielding (such as building ceilings and walls), altitude, and solar cycle are estimated. Cosmic-ray nucleons and muons can cause errors in current memories at a level of marginal significance, and there may be a very significant effect in the next generation of computer memory circuitry. Error rates increase rapidly with altitude, which may be used for testing to make electronic devices less sensitive to cosmic rays.
P.P.S. Вот статься в википедии, у которой кстати нету русской версии:
https://en.wikipedia.org/wiki/Soft_error
Once the electronics industry had determined how to control package contaminants, it became clear that other causes were also at work. James F. Ziegler led a program of work at IBM which culminated in the publication of a number of papers (Ziegler and Lanford, 1979) demonstrating that cosmic rays also could cause soft errors. Indeed, in modern devices, cosmic rays may be the predominant cause. Although the primary particle of the cosmic ray does not generally reach the Earth's surface, it creates a shower of energetic secondary particles. At the Earth's surface approximately 95% of the particles capable of causing soft errors are energetic neutrons with the remainder composed of protons and pions.[3] IBM estimated in 1996 that one error per month per 256 MiB of ram was expected for a desktop computer.[4] This flux of energetic neutrons is typically referred to as "cosmic rays" in the soft error literature. Neutrons are uncharged and cannot disturb a circuit on their own, but undergo neutron capture by the nucleus of an atom in a chip. This process may result in the production of charged secondaries, such as alpha particles and oxygen nuclei, which can then cause soft errors.
Cosmic ray flux depends on altitude. For the common reference location of 40.7° N, 74° W at sea level (New York City, NY, USA) the flux is approximately 14 neutrons/cm2/hour. Burying a system in a cave reduces the rate of cosmic-ray induced soft errors to a negligible level. In the lower levels of the atmosphere, the flux increases by a factor of about 2.2 for every 1000 m (1.3 for every 1000 ft) increase in altitude above sea level. Computers operated on top of mountains experience an order of magnitude higher rate of soft errors compared to sea level. The rate of upsets in aircraft may be more than 300 times the sea level upset rate. This is in contrast to package decay induced soft errors, which do not change with location.[5] As chip density increases, Intel expects the errors caused by cosmic rays to increase and be a limiting factor in design.[4]
The average rate of cosmic-ray soft errors is inversely proportional to sunspot activity. That is, the average number of cosmic-ray soft errors decreases during the active portion of the sunspot cycle and increases during the quiet portion. This counterintuitive result occurs for two reasons. The sun does not generally produce cosmic ray particles with energy above 1 GeV that are capable of penetrating to the Earth's upper atmosphere and creating particle showers, so the changes in the solar flux do not directly influence the number of errors. Further, the increase in the solar flux during an active sun period does have the effect of reshaping the Earth's magnetic field providing some additional shielding against higher energy cosmic rays, resulting in a decrease in the number of particles creating showers. The effect is fairly small in any case resulting in a ±7% modulation of the energetic neutron flux in New York City. Other locations are similarly affected.[citation needed]
Energetic neutrons produced by cosmic rays may lose most of their kinetic energy and reach thermal equilibrium with their surroundings as they are scattered by materials. The resulting neutrons are simply referred to as thermal neutrons and have an average kinetic energy of about 25 millielectron-volts at 25 °C. Thermal neutrons are also produced by environmental radiation sources such as the decay of naturally occurring uranium or thorium. The thermal neutron flux from sources other than cosmic-ray showers may still be noticeable in an underground location and an important contributor to soft errors for some circuits.
Ссылка номер 4 - это статья из журнала "New Scientist" за 2008 год:
https://www.newscientist.com/blog/technology/2008/03/do-we-need-cosmic-ray-alerts-for.html
Пишут, что от космической радиации спасает только засовывание компьютерного оборудования глубоко в пещеры
После рассказа, как перепаивали (!) ПЗУ, возник вопрос, почему не взяли подходящую панельку и не подключали на время отладки микросхему через неё. УКУ-ки держал в руках, они именно для измерений или испытаний.
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